Semiconductors

Jordan Valley provides a comprehensive family of metrology tools for semiconductors process control which enable accurate and precise measurements for countless thin-film applications. Based on multiple x-ray technologies, these tools deliver unmatched speed, precision and resolution required for all film types. Jordan Valley's systems deliver critical information on the thickness, composition, strain and material structure of advanced semiconductor materials at 32nm and below to more than 75% of the world's top 25 semiconductor manufacturers.